CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING

समान संसाधन

• DISLOCATION GEOMETRIES IN SEMICONDUCTORS AND IN SEMICONDUCTOR HETEROSTRUCTURES
  द्वारा: Cockayne, D, और अन्य
  प्रकाशित: (1991)
• LATTICE FRINGE IMAGING OF MODULATED STRUCTURES
  द्वारा: Cockayne, D, और अन्य
  प्रकाशित: (1981)
• RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
  द्वारा: Grovenor, C, और अन्य
  प्रकाशित: (1985)
• Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
  द्वारा: Anstis, G, और अन्य
  प्रकाशित: (2003)
• CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
  द्वारा: Zou, J, और अन्य
  प्रकाशित: (1991)