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CHEMICAL MICROANALYSIS OF SEMI...
Čujuhandieđut
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Doalvun: RefWorks
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Bissovaš liŋka
CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
Bibliográfalaš dieđut
Váldodahkkit:
Glaisher, R
,
Cockayne, D
Materiálatiipa:
Journal article
Almmustuhtton:
1993
Oažžasuvvandieđut
Govvádus
Geahča maid
Bargiidšearbma
Geahča maid
DISLOCATION GEOMETRIES IN SEMICONDUCTORS AND IN SEMICONDUCTOR HETEROSTRUCTURES
Dahkki: Cockayne, D, et al.
Almmustuhtton: (1991)
LATTICE FRINGE IMAGING OF MODULATED STRUCTURES
Dahkki: Cockayne, D, et al.
Almmustuhtton: (1981)
RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1985)
Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
Dahkki: Anstis, G, et al.
Almmustuhtton: (2003)
CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
Dahkki: Zou, J, et al.
Almmustuhtton: (1991)