Modelling of Kelvin probe surface voltage and photovoltage in dielectric-semiconductor interfaces
The characterisation of dielectric-semiconductor interfaces via Kelvin probe surface voltage and photovoltage has become a widespread method of extracting the electrical properties influencing optoelectronic devices. Kelvin probe offers a versatile, contactless and vacuum-less technique able to prov...
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| Formaat: | Journal article |
| Taal: | English |
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IOP Publishing
2022
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