An enhanced alneal process to produce SRV <1 cm/s in 1Ωcm n-type Si
The alneal is one of the most effective methods of electrically passivating a silicon surface, and has been used by numerous research groups since the 1980s. In this work, we present an enhanced alneal process that substantially improves its effectiveness. Previously, the success afforded by the sta...
Hlavní autoři: | Collett, K, Bonilla Osorio, R, Hamer, P, Bourret-Sicotte, G, Lobo, R, Kho, T, Wilshaw, P |
---|---|
Médium: | Journal article |
Vydáno: |
Elsevier
2017
|
Podobné jednotky
-
An enhanced alneal process to produce SRV < 1cm/s in 1 Ohmcm in n-type Si: data
Autor: Collett, K
Vydáno: (2017) -
Extremely low surface recombination in 1 Ω cm n-type monocrystalline silicon
Autor: Bonilla Osorio, R, a další
Vydáno: (2016) -
Surface passivation provided by an alneal through sio2/tio2 bilayer
Autor: Collett, K, a další
Vydáno: (2016) -
Data for 'Extremely low surface recombination in 1 Ωcm n-type monocrystalline silicon'
Autor: Bonilla, R, a další
Vydáno: (2016) -
Data used in "Surface Passivation Provided By An Alneal Through SiO2/TiO2 Bilayer"
Autor: Collett, K, a další
Vydáno: (2016)