Multiple film plane diagnostic for shocked lattice measurements (invited)

Multiple film plane diagnostic for shocked lattice measurements (invited)

Laser-based shock experiments have been conducted in thin Si and Cu crystals at pressures above the Hugoniot elastic limit. In these experiments, static film and x-ray streak cameras recorded x rays diffracted from lattice planes both parallel and perpendicular to the shock direction. These data, sh...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	Kalantar, D, Bringa, E, Caturla, M, Colvin, J, Lorenz, K, Kumar, M, Stolken, J, Allen, A, Rosolankova, K, Wark, J, Meyers, M, Schneider, M, Boehly, T
Формат:	Conference item
Хэвлэсэн:	2003

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