Materials analysis by aberration-corrected STEM
Electron-optical aberration correction has recently progressed from a promising concept to a powerful research tool. 100-120 kV scanning transmission electron microscopes (STEMs) equipped with spherical aberration (C-s) correctors now achieve sub-A resolution in high-angle annular dark field (HAADF)...
| Κύριοι συγγραφείς: | , , , , , , , |
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| Μορφή: | Conference item |
| Έκδοση: |
2005
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