Erratum: A study of (111) oriented epitaxial thin films of In 2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction (Journal of Materials Research (2012) 27 (2257-2264) DOI: 10.1557/jmr.2012.162)

Detaylı Bibliyografya
Asıl Yazarlar: Regoutz, A, Zhang, K, Egdell, R, Wermeille, D, Cowley, R
Materyal Türü: Journal article
Dil:English
Baskı/Yayın Bilgisi: 2012