Erratum: A study of (111) oriented epitaxial thin films of In 2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction (Journal of Materials Research (2012) 27 (2257-2264) DOI: 10.1557/jmr.2012.162)
Asıl Yazarlar: | , , , , |
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Materyal Türü: | Journal article |
Dil: | English |
Baskı/Yayın Bilgisi: |
2012
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