3D atom probe applications: past present and future
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Bibliographic Details
| Main Authors: |
G.D.W. Smith,
A. Cerezo |
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| Format: | Journal article
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| Language: | English |
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| Published: |
2005
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| Subjects: | |
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