Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
A focused ion beam system was used to prepare site specific transmission electron microscopy plan view specimens. A new technique was used for this purpose. It consisted of milling a wedge shaped piece of material, lifting it out using needle and micromanipulator, and orientating it on the substrate...
| 主要な著者: | , , , |
|---|---|
| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
2001
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