Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.

In order to fully exploit structure-property relations of nanomaterials, three-dimensional (3D) characterization at the atomic scale is often required. In recent years, the resolution of electron tomography has reached the atomic scale. However, such tomography typically requires several projection...

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Dades bibliogràfiques
Autors principals: De Backer, A, Jones, L, Lobato, I, Altantzis, T, Goris, B, Nellist, P, Bals, S, Van Aert, S
Format: Journal article
Idioma:English
Publicat: Royal Society of Chemistry 2017