Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.

In order to fully exploit structure-property relations of nanomaterials, three-dimensional (3D) characterization at the atomic scale is often required. In recent years, the resolution of electron tomography has reached the atomic scale. However, such tomography typically requires several projection...

Полное описание

Библиографические подробности
Главные авторы: De Backer, A, Jones, L, Lobato, I, Altantzis, T, Goris, B, Nellist, P, Bals, S, Van Aert, S
Формат: Journal article
Язык:English
Опубликовано: Royal Society of Chemistry 2017