Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

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Hlavní autoři: Dellby, N, Krivanek, O, Murfitt, M, Nellist, P
Médium: Journal article
Jazyk:English
Vydáno: 2005

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