Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

書目詳細資料
Main Authors: Dellby, N, Krivanek, O, Murfitt, M, Nellist, P
格式: Journal article
語言:English
出版: 2005