The microstructure of non-polar a-plane (11 2¯0) InGaN quantum wells
Atom probe tomography and quantitative scanning transmission electron microscopy are used to assess the composition of non-polar a-plane (11-20) InGaN quantum wells for applications in optoelectronics. The average quantum well composition measured by atom probe tomography and quantitative scanning t...
| Main Authors: | , , , , , , , , , , , , , , , , |
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| Format: | Journal article |
| Published: |
AIP Publishing
2016
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