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Focused ion-beam milling for f...
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Focused ion-beam milling for field-ion specimen preparation: preliminary investigations
Bibliographic Details
Main Authors:
Larson, D
,
Foord, D
,
Petford-Long, A
,
Anthony, T
,
Rozdilsky, I
,
Cerezo, A
,
Smith, G
Format:
Journal article
Published:
1998
Holdings
Description
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