Focused ion-beam milling for field-ion specimen preparation: preliminary investigations

Focused ion-beam milling for field-ion specimen preparation: preliminary investigations

Bibliografiske detaljer
Main Authors:	Larson, D, Foord, D, Petford-Long, A, Anthony, T, Rozdilsky, I, Cerezo, A, Smith, G
Format:	Journal article
Udgivet:	1998

Lignende værker

Field-ion specimen preparation using focused ion-beam milling
af: Larson, D, et al.
Udgivet: (1999)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
af: Larson, D, et al.
Udgivet: (1999)

Sharpening of field-ion specimens and positioning of features of interest by ion-beam milling
af: Larson, D, et al.
Udgivet: (2000)

Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
af: Langford, R, et al.
Udgivet: (2001)

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
af: Langford, R, et al.
Udgivet: (2001)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling
af: Huang, Y, et al.
Udgivet: (2002)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling.
af: Huang, Y, et al.
Udgivet: (2002)

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
af: Larson, D, et al.
Udgivet: (1998)

An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam
af: Halpin, J, et al.
Udgivet: (2019)

INSITU ION MILLING OF FIELD-ION SPECIMENS USING A LIQUID-METAL ION-SOURCE
af: Waugh, A, et al.
Udgivet: (1984)

FRACTURE OF FIELD-ION MICROSCOPE SPECIMENS
af: Wilkes, T, et al.
Udgivet: (1972)

Focused ion beam induced deposition of copper
af: Della Ratta, Anthony D. (Anthony David)
Udgivet: (2005)

Self-organized amorphous material in silicon(001) by focused ion beam (FIB) system
af: Huang, Y, et al.
Udgivet: (2005)

Focused Ion Beam Microfabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Focused Ion Beam Microfabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
af: Langford, R, et al.
Udgivet: (2001)

Focused Ion Beam Fabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Focused Ion Beam Fabrication
af: Lezec, Henri J., et al.
Udgivet: (2010)

Focused Ion Beam Fabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Focused Ion Beam Fabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Focused Ion Beam Fabrication
af: Musil, Christian, et al.
Udgivet: (2010)

Focused Ion Beam Fabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Fabrication of 3D microstructures using focused ion beam milling
af: Loo, Yee Wei.
Udgivet: (2008)

Focused Ion Beam Fabrication
af: Melngailis, John, et al.
Udgivet: (2010)

Focused ion beam fabrication of boron-doped diamond ultramicroelectrodes.
af: Hu, J, et al.
Udgivet: (2009)

Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
af: Korsunsky, A, et al.
Udgivet: (2018)

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
af: Salvati, E, et al.
Udgivet: (2019)

Xenon plasma focused ion beam lamella fabrication on high-pressure frozen specimens for structural cell biology
af: Berger, C, et al.
Udgivet: (2025)

Characterization of ionic liquid ion sources for focused ion beam applications
af: Perez Martinez, Carla S. (Carla Sofia)
Udgivet: (2013)

A review of focused ion beam sputtering
af: Ali, Mohammad Yeakub, et al.
Udgivet: (2010)

Focused ion beam assisted deposition of gold
af: Shedd, Gordon M.
Udgivet: (2005)

Focused ion beam systems : basics and applications /
af: Yao, Nan
Udgivet: (2007)

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
af: Sebastiani, M, et al.
Udgivet: (2014)

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
af: Sebastiani, M, et al.
Udgivet: (2014)

Optical cavity efficacy and lasing of focused ion beam milled GaN/InGaN micropillars
af: El-Ella, H, et al.
Udgivet: (2012)

Laser linking of metal interconnect : process considerations and failure analysis using focused ion beam milling
af: Rasera, Roy L. (Roy Louis)
Udgivet: (2006)

Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling
af: Uzun, F, et al.
Udgivet: (2024)

Fabrication of Bio-MEMS Nanostructure by focused ion beam
af: Ali, Mohammad Yeakub, et al.
Udgivet: (2010)

Investigation of Microholes Produced by Focused Ion Beam Micromachining
af: Mohd. Fuad, Nurul Hajar, et al.
Udgivet: (2010)

Investigation of microholes produced by focused ion beam micromachining
af: Mohd Fuad, Nurul Hajar, et al.
Udgivet: (2011)