Focused ion-beam milling for field-ion specimen preparation: preliminary investigations

Focused ion-beam milling for field-ion specimen preparation: preliminary investigations

Bibliografski detalji
Glavni autori:	Larson, D, Foord, D, Petford-Long, A, Anthony, T, Rozdilsky, I, Cerezo, A, Smith, G
Format:	Journal article
Izdano:	1998

Slični predmeti

Field-ion specimen preparation using focused ion-beam milling
od: Larson, D, i dr.
Izdano: (1999)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
od: Larson, D, i dr.
Izdano: (1999)

Sharpening of field-ion specimens and positioning of features of interest by ion-beam milling
od: Larson, D, i dr.
Izdano: (2000)

Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
od: Langford, R, i dr.
Izdano: (2001)

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
od: Langford, R, i dr.
Izdano: (2001)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling
od: Huang, Y, i dr.
Izdano: (2002)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling.
od: Huang, Y, i dr.
Izdano: (2002)

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
od: Larson, D, i dr.
Izdano: (1998)

An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam
od: Halpin, J, i dr.
Izdano: (2019)

INSITU ION MILLING OF FIELD-ION SPECIMENS USING A LIQUID-METAL ION-SOURCE
od: Waugh, A, i dr.
Izdano: (1984)

FRACTURE OF FIELD-ION MICROSCOPE SPECIMENS
od: Wilkes, T, i dr.
Izdano: (1972)

Focused ion beam induced deposition of copper
od: Della Ratta, Anthony D. (Anthony David)
Izdano: (2005)

Self-organized amorphous material in silicon(001) by focused ion beam (FIB) system
od: Huang, Y, i dr.
Izdano: (2005)

Focused Ion Beam Microfabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Focused Ion Beam Microfabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
od: Langford, R, i dr.
Izdano: (2001)

Focused Ion Beam Fabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Focused Ion Beam Fabrication
od: Lezec, Henri J., i dr.
Izdano: (2010)

Focused Ion Beam Fabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Focused Ion Beam Fabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Focused Ion Beam Fabrication
od: Musil, Christian, i dr.
Izdano: (2010)

Focused Ion Beam Fabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Fabrication of 3D microstructures using focused ion beam milling
od: Loo, Yee Wei.
Izdano: (2008)

Focused Ion Beam Fabrication
od: Melngailis, John, i dr.
Izdano: (2010)

Focused ion beam fabrication of boron-doped diamond ultramicroelectrodes.
od: Hu, J, i dr.
Izdano: (2009)

Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
od: Korsunsky, A, i dr.
Izdano: (2018)

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
od: Salvati, E, i dr.
Izdano: (2019)

Xenon plasma focused ion beam lamella fabrication on high-pressure frozen specimens for structural cell biology
od: Berger, C, i dr.
Izdano: (2025)

Characterization of ionic liquid ion sources for focused ion beam applications
od: Perez Martinez, Carla S. (Carla Sofia)
Izdano: (2013)

A review of focused ion beam sputtering
od: Ali, Mohammad Yeakub, i dr.
Izdano: (2010)

Focused ion beam assisted deposition of gold
od: Shedd, Gordon M.
Izdano: (2005)

Focused ion beam systems : basics and applications /
od: Yao, Nan
Izdano: (2007)

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
od: Sebastiani, M, i dr.
Izdano: (2014)

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
od: Sebastiani, M, i dr.
Izdano: (2014)

Optical cavity efficacy and lasing of focused ion beam milled GaN/InGaN micropillars
od: El-Ella, H, i dr.
Izdano: (2012)

Laser linking of metal interconnect : process considerations and failure analysis using focused ion beam milling
od: Rasera, Roy L. (Roy Louis)
Izdano: (2006)

Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling
od: Uzun, F, i dr.
Izdano: (2024)

Fabrication of Bio-MEMS Nanostructure by focused ion beam
od: Ali, Mohammad Yeakub, i dr.
Izdano: (2010)

Investigation of Microholes Produced by Focused Ion Beam Micromachining
od: Mohd. Fuad, Nurul Hajar, i dr.
Izdano: (2010)

Investigation of microholes produced by focused ion beam micromachining
od: Mohd Fuad, Nurul Hajar, i dr.
Izdano: (2011)