Synchrotron based reciprocal space mapping and dislocation substructure analysis

During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dis...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Hofmann, F, Song, X, Eve, S, Collins, S, Korsunsky, A
स्वरूप: Journal article
भाषा:English
प्रकाशित: Elsevier 2009
विषय: