Synchrotron based reciprocal space mapping and dislocation substructure analysis

During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dis...

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Main Authors: Hofmann, F, Song, X, Eve, S, Collins, S, Korsunsky, A
格式: Journal article
语言:English
出版: Elsevier 2009
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