Direct-write non-linear photolithography for semiconductor nanowire characterization.
A practical bottleneck prohibiting the rapid, confident and damage-free electrical contacting of vapour-liquid-solid grown nanowires arises from the random spatial distribution and variation in quality of the nanowires, and the contact dimensions required. Established techniques such as electron-bea...
Autors principals: | Parkinson, P, Jiang, N, Gao, Q, Tan, H, Jagadish, C |
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Format: | Journal article |
Idioma: | English |
Publicat: |
IOP Publishing
2012
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