Study of elementary surface acoustic wave phenomena
Many attempts have been made in acoustic microscopy to both achieve nanometer lateral resolution and sub-A wave amplitude detection. Employing a scanning acoustic force microscopy technique, acoustic wave properties of arbitrarily polarized modes can be measured with sub-wavelength resolution and hi...
| Main Authors: | , |
|---|---|
| Format: | Journal article |
| Language: | English |
| Published: |
2001
|