Study of elementary surface acoustic wave phenomena
Many attempts have been made in acoustic microscopy to both achieve nanometer lateral resolution and sub-A wave amplitude detection. Employing a scanning acoustic force microscopy technique, acoustic wave properties of arbitrarily polarized modes can be measured with sub-wavelength resolution and hi...
Main Authors: | , |
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Format: | Journal article |
Language: | English |
Published: |
2001
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_version_ | 1797100863679889408 |
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author | Hesjedal, T Behme, G |
author_facet | Hesjedal, T Behme, G |
author_sort | Hesjedal, T |
collection | OXFORD |
description | Many attempts have been made in acoustic microscopy to both achieve nanometer lateral resolution and sub-A wave amplitude detection. Employing a scanning acoustic force microscopy technique, acoustic wave properties of arbitrarily polarized modes can be measured with sub-wavelength resolution and high sensitivity. Surface acoustic wave fields of elementary model systems like a single scatterer and a single wave source are analysed in detail. We are able to observe radiation patterns, revealing the influence of the anisotropy of the GaAs substrate and the angular distribution of the piezoelectric coupling coefficient. |
first_indexed | 2024-03-07T05:43:42Z |
format | Journal article |
id | oxford-uuid:e6787a91-72eb-4996-b653-d2a3db62c1c3 |
institution | University of Oxford |
language | English |
last_indexed | 2024-03-07T05:43:42Z |
publishDate | 2001 |
record_format | dspace |
spelling | oxford-uuid:e6787a91-72eb-4996-b653-d2a3db62c1c32022-03-27T10:31:20ZStudy of elementary surface acoustic wave phenomenaJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e6787a91-72eb-4996-b653-d2a3db62c1c3EnglishSymplectic Elements at Oxford2001Hesjedal, TBehme, GMany attempts have been made in acoustic microscopy to both achieve nanometer lateral resolution and sub-A wave amplitude detection. Employing a scanning acoustic force microscopy technique, acoustic wave properties of arbitrarily polarized modes can be measured with sub-wavelength resolution and high sensitivity. Surface acoustic wave fields of elementary model systems like a single scatterer and a single wave source are analysed in detail. We are able to observe radiation patterns, revealing the influence of the anisotropy of the GaAs substrate and the angular distribution of the piezoelectric coupling coefficient. |
spellingShingle | Hesjedal, T Behme, G Study of elementary surface acoustic wave phenomena |
title | Study of elementary surface acoustic wave phenomena |
title_full | Study of elementary surface acoustic wave phenomena |
title_fullStr | Study of elementary surface acoustic wave phenomena |
title_full_unstemmed | Study of elementary surface acoustic wave phenomena |
title_short | Study of elementary surface acoustic wave phenomena |
title_sort | study of elementary surface acoustic wave phenomena |
work_keys_str_mv | AT hesjedalt studyofelementarysurfaceacousticwavephenomena AT behmeg studyofelementarysurfaceacousticwavephenomena |