Determination of X-ray flux using silicon pin diodes

Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here...

詳細記述

書誌詳細
主要な著者: Owen, R, Holton, J, Schulze-Briese, C, Garman, E
フォーマット: Journal article
言語:English
出版事項: International Union of Crystallography 2009
主題:

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