High dose efficiency atomic resolution imaging via electron ptychography

High dose efficiency atomic resolution imaging via electron ptychography

Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than co...

Descripció completa

Dades bibliogràfiques
Autors principals:	Pennycook, TJ, Martinez, GT, Nellist, PD, Meyer, JC
Format:	Journal article
Idioma:	English
Publicat:	Elsevier 2018

Ítems similars

Atomic-scale imaging of polyvinyl alcohol crystallinity using electron ptychography
per: Hao, B, et al.
Publicat: (2023)

Deterministic electron ptychography at atomic resolution
per: D'Alfonso, A, et al.
Publicat: (2014)

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
per: Yang, H, et al.
Publicat: (2016)

Applications of low dose electron ptychography
per: Kirkland, A, et al.
Publicat: (2022)

Contrast transfer and noise minimization in electron ptychography
per: O'Leary, CM, et al.
Publicat: (2019)

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
per: H. Yang, et al.
Publicat: (2016-08-01)

Contrast transfer and noise considerations in focused-probe electron ptychography
per: O'Leary, CM, et al.
Publicat: (2020)

Quantitative electron ptychography for simultaneous light and heavy elements atom counting
per: Liberti, E, et al.
Publicat: (2022)

Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector
per: Song, J, et al.
Publicat: (2019)

The effect of dynamical scattering on single-plane phase retrieval in electron ptychography
per: Clark, L, et al.
Publicat: (2022)

Electron ptychography. I. Experimental demonstration beyond the conventional resolution limits
per: Nellist, P, et al.
Publicat: (1998)

Atomic resolution Z-contrast imaging of ultradispersed catalysts
per: Nellist, P, et al.
Publicat: (1997)

Low-dose cryo-electron ptychography of proteins at sub-nanometer resolution
per: Berk Küçükoğlu, et al.
Publicat: (2024-09-01)

Low-dose cryo-electron ptychography of proteins at sub-nanometer resolution
per: Kucukoglu Berk, et al.
Publicat: (2024-01-01)

Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography
per: Guanxing Li, et al.
Publicat: (2025-01-01)

Quantitative comparison of HRTEM and electron ptychography
per: Bennemann Felix, et al.
Publicat: (2024-01-01)

Subsampled STEM-ptychography
per: Stevens, A, et al.
Publicat: (2018)

Making the link between ADF and 4D STEM: Resolution, transfer and coherence
per: Nellist, PD, et al.
Publicat: (2024)

Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography
per: Lozano, J, et al.
Publicat: (2018)

Low-dose phase retrieval of biological specimens using cryo-electron ptychography
per: Zhou, L, et al.
Publicat: (2020)

Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose
per: Zhen Chen, et al.
Publicat: (2020-06-01)

Direct structure determination by atomic-resolution incoherent STEM imaging
per: Nellist, P, et al.
Publicat: (1997)

Multidimensional Electron Ptychography
per: Lei Yu, et al.
Publicat: (2024-01-01)

Direct imaging of the atomic configuration of ultradispersed catalysts
per: Nellist, P, et al.
Publicat: (1996)

Efficient boundary-guided scanning for high-resolution X-ray ptychography
per: Dergan Lin, et al.
Publicat: (2024-01-01)

Alternating-probe electron ptychography
per: Zhao Meng, et al.
Publicat: (2024-01-01)

Vibration-Corrected Electron Ptychography
per: Gladyshev Anton, et al.
Publicat: (2024-01-01)

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution.
per: Pennycook, T, et al.
Publicat: (2014)

Automatic parameter selection for electron ptychography via Bayesian optimization
per: Michael C. Cao, et al.
Publicat: (2022-07-01)

Subangstrom resolution by underfocused incoherent transmission electron microscopy
per: Nellist, P, et al.
Publicat: (1998)

Imaging Correlography Using Ptychography
per: Zhixin Li, et al.
Publicat: (2019-10-01)

Lensless Imaging via Blind Ptychography Modulation and Wavefront Separation
per: Cheng Xu, et al.
Publicat: (2023-02-01)

ELECTRON MICROSCOPY Atomic resolution comes into phase
per: Nellist, P
Publicat: (2012)

Subangstrom resolution imaging using annular dark-field STEM
per: Nellist, P, et al.
Publicat: (1999)

Ptychography at finite dose in SrTiO3
per: Dearg Malcolm, et al.
Publicat: (2024-01-01)

New paradigm for ultra-low-dose high-resolution imaging through a dedicated event-driven analytical ptychography methodology
per: Lalandec-Robert Hoelen L., et al.
Publicat: (2024-01-01)

A new approach for 3D quantitative STEM using defocus corrected electron ptychography
per: Mostaed, A, et al.
Publicat: (2022)

Determination of atomic structure at surfaces and interfaces by high-resolution stem
per: Pennycook, S, et al.
Publicat: (1997)

Study of Image Classification Accuracy with Fourier Ptychography
per: Hongbo Zhang, et al.
Publicat: (2021-05-01)

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
per: E, H, et al.
Publicat: (2013)