High dose efficiency atomic resolution imaging via electron ptychography

High dose efficiency atomic resolution imaging via electron ptychography

Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than co...

書誌詳細
主要な著者:	Pennycook, TJ, Martinez, GT, Nellist, PD, Meyer, JC
フォーマット:	Journal article
言語:	English
出版事項:	Elsevier 2018

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