Electron nanodiffraction using sharply focused parallel probes

The authors describe an electron-optical configuration for producing a nanometer-scale sharply focused parallel electron probe in the transmission electron microscope. The configuration utilizes one of the round lenses in an objective prefield aberration corrector and generates a sharply focused par...

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Bibliographic Details
Main Authors: Dwyer, C, Kirkland, A, Hartel, P, Mueller, H, Haider, M
Format: Journal article
Language:English
Published: 2007