Electron nanodiffraction using sharply focused parallel probes
The authors describe an electron-optical configuration for producing a nanometer-scale sharply focused parallel electron probe in the transmission electron microscope. The configuration utilizes one of the round lenses in an objective prefield aberration corrector and generates a sharply focused par...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2007
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| _version_ | 1797101075255263232 |
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| author | Dwyer, C Kirkland, A Hartel, P Mueller, H Haider, M |
| author_facet | Dwyer, C Kirkland, A Hartel, P Mueller, H Haider, M |
| author_sort | Dwyer, C |
| collection | OXFORD |
| description | The authors describe an electron-optical configuration for producing a nanometer-scale sharply focused parallel electron probe in the transmission electron microscope. The configuration utilizes one of the round lenses in an objective prefield aberration corrector and generates a sharply focused parallel probe of 10 nm in diameter, with better than 0.2 nm edge acuity. Such a probe makes it possible to obtain electron diffraction patterns from nanometer-scale volumes of the specimen with unprecedented precision. A method for measuring the transverse coherence of the probe is also described. © 2007 American Institute of Physics. |
| first_indexed | 2024-03-07T05:46:46Z |
| format | Journal article |
| id | oxford-uuid:e77b2b1b-710b-4fb0-b3e7-aca2b4381ef2 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T05:46:46Z |
| publishDate | 2007 |
| record_format | dspace |
| spelling | oxford-uuid:e77b2b1b-710b-4fb0-b3e7-aca2b4381ef22022-03-27T10:39:00ZElectron nanodiffraction using sharply focused parallel probesJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e77b2b1b-710b-4fb0-b3e7-aca2b4381ef2EnglishSymplectic Elements at Oxford2007Dwyer, CKirkland, AHartel, PMueller, HHaider, MThe authors describe an electron-optical configuration for producing a nanometer-scale sharply focused parallel electron probe in the transmission electron microscope. The configuration utilizes one of the round lenses in an objective prefield aberration corrector and generates a sharply focused parallel probe of 10 nm in diameter, with better than 0.2 nm edge acuity. Such a probe makes it possible to obtain electron diffraction patterns from nanometer-scale volumes of the specimen with unprecedented precision. A method for measuring the transverse coherence of the probe is also described. © 2007 American Institute of Physics. |
| spellingShingle | Dwyer, C Kirkland, A Hartel, P Mueller, H Haider, M Electron nanodiffraction using sharply focused parallel probes |
| title | Electron nanodiffraction using sharply focused parallel probes |
| title_full | Electron nanodiffraction using sharply focused parallel probes |
| title_fullStr | Electron nanodiffraction using sharply focused parallel probes |
| title_full_unstemmed | Electron nanodiffraction using sharply focused parallel probes |
| title_short | Electron nanodiffraction using sharply focused parallel probes |
| title_sort | electron nanodiffraction using sharply focused parallel probes |
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