Electron nanodiffraction using sharply focused parallel probes
The authors describe an electron-optical configuration for producing a nanometer-scale sharply focused parallel electron probe in the transmission electron microscope. The configuration utilizes one of the round lenses in an objective prefield aberration corrector and generates a sharply focused par...
Main Authors: | Dwyer, C, Kirkland, A, Hartel, P, Mueller, H, Haider, M |
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Format: | Journal article |
Language: | English |
Published: |
2007
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