APPLICATION OF TRANSMISSION ION CHANNELING TO THE IMAGING OF STACKING-FAULTS
The Nuclear Microprobe at the University of Oxford has been employed to produce images of crystal defects using transmission ion channeling This paper describes the experimental set-up for the technique and shows how images of stacking faults near the surface of a 40 mu m thick silicon crystal can b...
Main Authors: | King, P, Breese, M, Wilshaw, P, Grime, G |
---|---|
Format: | Conference item |
Izdano: |
1995
|
Podobne knjige/članki
-
Stacking-fault imaging using transmission ion channeling.
od: King, P, et al.
Izdano: (1995) -
IMAGING OF DEEP DEFECTS USING TRANSMISSION ION CHANNELING
od: King, P, et al.
Izdano: (1995) -
TRANSMISSION ION CHANNELING IMAGES OF CRYSTAL DEFECTS
od: King, P, et al.
Izdano: (1995) -
CRYSTAL DEFECT IMAGING USING TRANSMISSION ION CHANNELING
od: King, P, et al.
Izdano: (1994) -
Defect imaging and channeling studies using channeling scanning transmission ion microscopy
od: King, P, et al.
Izdano: (1996)