Microanalysis at the atomic level
The optical arrangement of the high-resolution scanning transmission electron microscope (STEM) allows incoherent imaging conditions to be established simultaneously for both elastically and inelastically scattered electrons, with good detection efficiencies. For zone axis illumination and localized...
| Автори: | , , , , , |
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| Формат: | Conference item |
| Опубліковано: |
1995
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