Rapid patterning of single-wall carbon nanotubes by interlayer lithography.

High resolution patterning of single-wall carbon nanotubes is achieved using interlayer lithography. Minimum feature sizes of 6 and 0.7 μm are demonstrated on glass and silicon, using the negative photoresist SU-8 and the positive photoresist AZ7220, respectively. Films patterned using SU-8 have a g...

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Main Authors: Leem, D, Kim, S, Kim, J, Sohn, J, Edwards, A, Huang, J, Wang, X, Bradley, D, Demello, J
Format: Journal article
Language:English
Published: 2010
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author Leem, D
Kim, S
Kim, J
Sohn, J
Edwards, A
Huang, J
Wang, X
Kim, J
Bradley, D
Demello, J
author_facet Leem, D
Kim, S
Kim, J
Sohn, J
Edwards, A
Huang, J
Wang, X
Kim, J
Bradley, D
Demello, J
author_sort Leem, D
collection OXFORD
description High resolution patterning of single-wall carbon nanotubes is achieved using interlayer lithography. Minimum feature sizes of 6 and 0.7 μm are demonstrated on glass and silicon, using the negative photoresist SU-8 and the positive photoresist AZ7220, respectively. Films patterned using SU-8 have a good balance of transparency and sheet-resistance, and are shown to be effective electrodes for organic solar cells. Copyright © 2010 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim.
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spelling oxford-uuid:eaa0bccf-3182-4b0b-8941-677e07a9693b2022-03-27T11:03:37ZRapid patterning of single-wall carbon nanotubes by interlayer lithography.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:eaa0bccf-3182-4b0b-8941-677e07a9693bEnglishSymplectic Elements at Oxford2010Leem, DKim, SKim, JSohn, JEdwards, AHuang, JWang, XKim, JBradley, DDemello, JHigh resolution patterning of single-wall carbon nanotubes is achieved using interlayer lithography. Minimum feature sizes of 6 and 0.7 μm are demonstrated on glass and silicon, using the negative photoresist SU-8 and the positive photoresist AZ7220, respectively. Films patterned using SU-8 have a good balance of transparency and sheet-resistance, and are shown to be effective electrodes for organic solar cells. Copyright © 2010 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim.
spellingShingle Leem, D
Kim, S
Kim, J
Sohn, J
Edwards, A
Huang, J
Wang, X
Kim, J
Bradley, D
Demello, J
Rapid patterning of single-wall carbon nanotubes by interlayer lithography.
title Rapid patterning of single-wall carbon nanotubes by interlayer lithography.
title_full Rapid patterning of single-wall carbon nanotubes by interlayer lithography.
title_fullStr Rapid patterning of single-wall carbon nanotubes by interlayer lithography.
title_full_unstemmed Rapid patterning of single-wall carbon nanotubes by interlayer lithography.
title_short Rapid patterning of single-wall carbon nanotubes by interlayer lithography.
title_sort rapid patterning of single wall carbon nanotubes by interlayer lithography
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