Scanning acoustic force microscope investigations of surface acoustic waves
We report on the investigation of surface acoustic wave (SAW) fields by scanning acoustic force microscopy (SAFM), reaching submicron lateral resolution. The SAFM is based on a standard atomic force microscope and utilizes the non-linear force curve in the sense of a mechanical diode. The surface os...
| Main Authors: | , , |
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| פורמט: | Journal article |
| יצא לאור: |
1997
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