Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Detalles Bibliográficos
Autores principales:	Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D
Formato:	Journal article
Publicado:	2008

Ejemplares similares