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Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films

Detalhes bibliográficos
Principais autores: Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D
Formato: Journal article
Publicado em: 2008
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