Filamentary high-resolution electrical probes for nanoengineering
Confining electric fields to a nanoscale region is challenging yet crucial for applications such as high resolution probing of electrical properties of materials and electric-field manipulation of nanoparticles. State-of-the-art techniques involving atomic force microscopy typically have a lateral r...
主要な著者: | Soh, EJH, Sarwat, GS, Mazzotta, G, Porter, BF, Riede, M, Nicholas, R, Kim, JS, Bhaskaran, H |
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フォーマット: | Journal article |
言語: | English |
出版事項: |
American Chemical Society
2020
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主題: |
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