Filamentary high-resolution electrical probes for nanoengineering

Confining electric fields to a nanoscale region is challenging yet crucial for applications such as high resolution probing of electrical properties of materials and electric-field manipulation of nanoparticles. State-of-the-art techniques involving atomic force microscopy typically have a lateral r...

詳細記述

書誌詳細
主要な著者: Soh, EJH, Sarwat, GS, Mazzotta, G, Porter, BF, Riede, M, Nicholas, R, Kim, JS, Bhaskaran, H
フォーマット: Journal article
言語:English
出版事項: American Chemical Society 2020
主題:

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