Filamentary high-resolution electrical probes for nanoengineering
Confining electric fields to a nanoscale region is challenging yet crucial for applications such as high resolution probing of electrical properties of materials and electric-field manipulation of nanoparticles. State-of-the-art techniques involving atomic force microscopy typically have a lateral r...
Príomhchruthaitheoirí: | Soh, EJH, Sarwat, GS, Mazzotta, G, Porter, BF, Riede, M, Nicholas, R, Kim, JS, Bhaskaran, H |
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Formáid: | Journal article |
Teanga: | English |
Foilsithe / Cruthaithe: |
American Chemical Society
2020
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Ábhair: |
Míreanna comhchosúla
Míreanna comhchosúla
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