FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Grovenor, C, Cerezo, A, Smith, G
Μορφή:	Journal article
Γλώσσα:	English
Έκδοση:	Inst of Physics 1983

Παρόμοια τεκμήρια

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RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
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RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
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Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
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A FIELD-ION MICROSCOPY AND ATOM PROBE STUDY OF AGING BEHAVIOR OF A CO-BEARING MARAGING-STEEL
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Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
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ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A MODEL FE-NI-CO-MO MARAGING-STEEL
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Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy.
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Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
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SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
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Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
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MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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Microscopy and microanalysis [jurnal elektronik]

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Imaging of radiation damage using complementary field ion microscopy and atom probe tomography.
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Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
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Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
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Imaging of radiation damage using complementary field ion microscopy and atom probe tomography
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Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
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