FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Xehetasun bibliografikoak
Egile Nagusiak:	Grovenor, C, Cerezo, A, Smith, G
Formatua:	Journal article
Hizkuntza:	English
Argitaratua:	Inst of Physics 1983

Antzeko izenburuak

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Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
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Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
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