FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Antzeko izenburuak

• RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
  nork: Grovenor, C, et al.
  Argitaratua: (1985)
• FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
  nork: Godfrey, T, et al.
  Argitaratua: (1989)
• FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
  nork: Rose, J, et al.
  Argitaratua: (1986)
• RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
  nork: Grovenor, C, et al.
  Argitaratua: (1990)
• RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
  nork: Grovenor, C, et al.
  Argitaratua: (1990)