AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES

Samankaltaisia teoksia

• MICROSTRUCTURAL OBSERVATIONS OF TA/AL SUPERLATTICES BY TEM
  Tekijä: Jiang, S, et al.
  Julkaistu: (1992)
• Diffraction behaviour of three-component Fibonacci Ta/Al multilayer films
  Tekijä: Jiang, S, et al.
  Julkaistu: (1997)
• PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION
  Tekijä: Jiang, S, et al.
  Julkaistu: (1995)
• Fracture properties of GaAs-AlAs superlattices studied by atomic force microscopy and scanning electron microscopy
  Tekijä: Castell, M, et al.
  Julkaistu: (1998)
• Electron crystallography : electron microscopy and electron diffraction /
  Tekijä: 529189 Zou, Xiaodong, et al.
  Julkaistu: (2011)