Structural modelling of nano-amorphous Si-O-N films in silicon nitride ceramics

In order to obtain a detailed computational description of the structure and fundamental properties of silicon oxynitride films as thin as 1mn in Si3N4 ceramics, a reliable and transferable many-body inter-atomic potential has been developed for Si-N-O systems and used to perform molecular dynamic (...

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Bibliographic Details
Main Authors: Nguyen-Manh, D, Cockayne, D, Doeblinger, M, Marsh, C, Sutton, A, van Duin, A
Format: Conference item
Published: 2004