Site‐specific specimen preparation for SIMS analysis of radioactive samples

Site‐specific specimen preparation for SIMS analysis of radioactive samples

Secondary Ion Mass Spectrometry is an important technique for the study of the composition of a wide range of materials because of the exceptionally high sensitivity that allows the study of trace elements and the ability to distinguish isotopes that can be used as markers for reactions and transpor...

書誌詳細
主要な著者:	Liu, J, Li, K, Lozano-Perez, S, Grovenor, CRM
フォーマット:	Journal article
言語:	English
出版事項:	Wiley 2020

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