Electronic structure at realistic Si(100)-SiO2 interfaces

Ижил төстэй зүйлс

• Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
  -н: Giustino, F, зэрэг
  Хэвлэсэн: (2005)
• Atomic-scale modelling of the Si(100)-SiO(2) interface
  -н: Giustino, F, зэрэг
  Хэвлэсэн: (2005)
• Proton-induced fixed positive charge at the Si(100)-SiO2 interface.
  -н: Godet, J, зэрэг
  Хэвлэсэн: (2007)
• Modeling of Si 2p core-level shifts at Si-(ZrO(2))(x)(SiO(2))(1-x) interfaces
  -н: Giustino, F, зэрэг
  Хэвлэсэн: (2002)
• Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
  -н: Giustino, F, зэрэг
  Хэвлэсэн: (2005)