Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

Xehetasun bibliografikoak
Egile Nagusiak:	Behan, G, Nellist, P
Formatua:	Conference item
Argitaratua:	2008

Antzeko izenburuak

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