Defect imaging and channeling studies using channeling scanning transmission ion microscopy
The technique of channeling scanning transmission ion microscopy (CSTIM) can be used to produce images of individual crystal defects (such as dislocations and stacking faults) using the scanned, focused ion beam from a nuclear microprobe. As well as offering a new method for studies of crystal defec...
| Asıl Yazarlar: | , , , , |
|---|---|
| Materyal Türü: | Conference item |
| Baskı/Yayın Bilgisi: |
1996
|