Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
语言
全文检索
题名
作者
主题
索引号
ISBN/ISSN
标签
检索
高级检索
Bias-dependent STM investigati...
引用
发送短信
推荐此
打印
导出纪录
导出到 RefWorks
导出到 EndNoteWeb
导出到 EndNote
Permanent link
Bias-dependent STM investigations of trimethylgallium adsorption on Si(001) at elevated temperatures
书目详细资料
Main Authors:
Norenberg, H
,
Bowler, DR
,
Briggs, G
格式:
Conference item
出版:
1998
持有资料
实物特征
相似书籍
职员浏览
相似书籍
ADSORPTION OF TRIMETHYLGALLIUM ON SEMICONDUCTOR SURFACES - STM OBSERVATIONS
由: Mayne, A, et al.
出版: (1993)
An elevated temperature STM study of the Si(001) c(4x4) surface reconstruction
由: Norenberg, H, et al.
出版: (1999)
Elevated-temperature STM study of Ge and Si growth on Si(001) from GeH4 and Si2H6
由: Owen, J, et al.
出版: (1997)
IDENTIFICATION OF THE SI(001) MISSING DIMER DEFECT STRUCTURE BY LOW-BIAS VOLTAGE STM AND LDA MODELING
由: Owen, J, et al.
出版: (1995)
Comparative STM and RHEED studies of Ge/Si(001) and Si/Ge/Si(001) surfaces
由: Goldfarb, I, et al.
出版: (1999)