NanoSIMS imaging and analysis in materials science

High-resolution SIMS analysis can be used to explore a wide range of problems in material science and engineering materials, especially when chemical imaging with good spatial resolution (50–100 nm) can be combined with efficient detection of light elements and precise separation of isotopes and iso...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak: Li, K, Liu, J, Grovenor, CRM, Moore, KL
Formatua: Journal article
Hizkuntza:English
Argitaratua: Annual Reviews 2020