THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Cockayne, D
Μορφή:	Journal article
Έκδοση:	1972

Παρόμοια τεκμήρια

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Έκδοση: (1981)

PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
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Applications of the weak beam technique of electron microscopy
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DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
ανά: Cockayne, D, κ.ά.
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Έκδοση: (1976)

DETERMINATION OF GEOMETRY AND NATURE OF SMALL FRANK LOOPS USING WEAK-BEAM METHOD
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Έκδοση: (1973)

The benefits of energy-filtering in weak-beam microscopy
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WEAK-BEAM ELECTRON-MICROSCOPY ANALYSIS OF DEFECT CLUSTERS IN HEAVY-ION IRRADIATED SILVER AND COPPER
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Έκδοση: (1975)

CALCULATED ASYMMETRY FOR WEAK BEAM INTRINSIC STACKING-FAULT IMAGES
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Έκδοση: (1985)

INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS
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Έκδοση: (1969)

ADVANCED TECHNIQUES OF ELECTRON-MICROSCOPY FOR STUDYING MATERIALS
ανά: Cockayne, D
Έκδοση: (1985)

13TH AUSTRALIAN CONFERENCE ON ELECTRON-MICROSCOPY, FEBRUARY-1994
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Έκδοση: (1994)

WEAK-BEAM TECHNIQUE APPLIED TO SUPERLATTICE DISLOCATIONS IN AN IRON-ALUMINIUM ALLOY
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Έκδοση: (1970)

POTENTIALITIES AND LIMITATIONS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CRYSTAL LATTICES AND THEIR IMPERFECTIONS
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ανά: Crawford, R, κ.ά.
Έκδοση: (1973)

Microscopy of materials: modern imaging methods using electron,x-ray and ion beams /
ανά: Bowen, D. Keith (David Keith), 1940-, κ.ά.
Έκδοση: (1975)

Techniques for Reducing Beam-Induced Damage in Electron Microscopy
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ανά: Yi Li, κ.ά.
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Correlative Analysis of Immunoreactivity in Confocal Laser-Scanning Microscopy and Scanning Electron Microscopy with Focused Ion Beam Milling
ανά: Takahiro eSonomura, κ.ά.
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AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES
ανά: Jiang, S, κ.ά.
Έκδοση: (1992)

Electron-beam patterned calibration structures for structured illumination microscopy
ανά: Sangeetha Hari, κ.ά.
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Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
ανά: McBride, W, κ.ά.
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Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
ανά: Langford, R, κ.ά.
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CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
ανά: Zou, J, κ.ά.
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Celebrations in Pioneering Electron Microscopy: A Symposium in Honor of Professor Archie Howie-Introduction.
ανά: Gai, P, κ.ά.
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Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate
ανά: Zou, J, κ.ά.
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Electron microscopy : methods and protocols /
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