THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

Bibliográfalaš dieđut
Váldodahkki:	Cockayne, D
Materiálatiipa:	Journal article
Almmustuhtton:	1972

Geahča maid

WEAK-BEAM ELECTRON-MICROSCOPY
Dahkki: Cockayne, D
Almmustuhtton: (1981)

PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
Dahkki: Cockayne, D
Almmustuhtton: (1973)

Applications of the weak beam technique of electron microscopy
Dahkki: Cockayne, D
Almmustuhtton: (1999)

DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
Dahkki: Cockayne, D, et al.
Almmustuhtton: (1979)

STUDY OF GUINIER-PRESTON ZONES IN ALUMINUM-COPPER ALLOYS USING WEAK-BEAM TECHNIQUE OF ELECTRON-MICROSCOPY
Dahkki: Yoshida, H, et al.
Almmustuhtton: (1976)

DETERMINATION OF GEOMETRY AND NATURE OF SMALL FRANK LOOPS USING WEAK-BEAM METHOD
Dahkki: Jenkins, M, et al.
Almmustuhtton: (1973)

The benefits of energy-filtering in weak-beam microscopy
Dahkki: Jenkins, M, et al.
Almmustuhtton: (2003)

WEAK-BEAM ELECTRON-MICROSCOPY ANALYSIS OF DEFECT CLUSTERS IN HEAVY-ION IRRADIATED SILVER AND COPPER
Dahkki: Jenkins, M
Almmustuhtton: (1974)

STUDIES OF LATTICE-DEFECTS USING WEAK DIFFRACTED BEAMS
Dahkki: Cockayne, D, et al.
Almmustuhtton: (1975)

CALCULATED ASYMMETRY FOR WEAK BEAM INTRINSIC STACKING-FAULT IMAGES
Dahkki: Wilson, A, et al.
Almmustuhtton: (1985)

INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS
Dahkki: Cockayne, D, et al.
Almmustuhtton: (1969)

ADVANCED TECHNIQUES OF ELECTRON-MICROSCOPY FOR STUDYING MATERIALS
Dahkki: Cockayne, D
Almmustuhtton: (1985)

13TH AUSTRALIAN CONFERENCE ON ELECTRON-MICROSCOPY, FEBRUARY-1994
Dahkki: Cockayne, D
Almmustuhtton: (1994)

WEAK-BEAM TECHNIQUE APPLIED TO SUPERLATTICE DISLOCATIONS IN AN IRON-ALUMINIUM ALLOY
Dahkki: Ray, I, et al.
Almmustuhtton: (1970)

POTENTIALITIES AND LIMITATIONS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CRYSTAL LATTICES AND THEIR IMPERFECTIONS
Dahkki: Cockayne, D
Almmustuhtton: (1975)

Automatic beam optimization method for scanning electron microscopy based on electron beam Kernel estimation
Dahkki: Yunje Cho, et al.
Almmustuhtton: (2024-06-01)

Transmission electron microscopy investigation of semiconductor quantum dots
Dahkki: Liao, X, et al.
Almmustuhtton: (2000)

New possibilities with aberration-corrected electron microscopy.
Dahkki: Cockayne, D, et al.
Almmustuhtton: (2009)

Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
Dahkki: Nellist, P, et al.
Almmustuhtton: (2008)

Electron-beam broadening in electron microscopy by solving the electron transport equation
Dahkki: Erich Müller, et al.
Almmustuhtton: (2020-12-01)

WEAK-BEAM TECHNIQUE APPLIED TO SUPERLATTICE DISLOCATIONS IN IRON-ALUMINUM ALLOYS .2. FOURFOLD DISSOCIATION IN DO3-TYPE ORDER
Dahkki: Crawford, R, et al.
Almmustuhtton: (1973)

Microscopy of materials: modern imaging methods using electron,x-ray and ion beams /
Dahkki: Bowen, D. Keith (David Keith), 1940-, et al.
Almmustuhtton: (1975)

Techniques for Reducing Beam-Induced Damage in Electron Microscopy
Dahkki: Abedzadeh, Navid
Almmustuhtton: (2022)

Photoemission sources and beam blankers for ultrafast electron microscopy
Dahkki: Lixin Zhang, et al.
Almmustuhtton: (2019-09-01)

The cage effect of electron beam irradiation damage in cryo-electron microscopy
Dahkki: Yi Li, et al.
Almmustuhtton: (2024-05-01)

Correlative Analysis of Immunoreactivity in Confocal Laser-Scanning Microscopy and Scanning Electron Microscopy with Focused Ion Beam Milling
Dahkki: Takahiro eSonomura, et al.
Almmustuhtton: (2013-02-01)

AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES
Dahkki: Jiang, S, et al.
Almmustuhtton: (1992)

Electron-beam patterned calibration structures for structured illumination microscopy
Dahkki: Sangeetha Hari, et al.
Almmustuhtton: (2022-11-01)

Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
Dahkki: McBride, W, et al.
Almmustuhtton: (2003)

Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
Dahkki: Langford, R, et al.
Almmustuhtton: (2001)

CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
Dahkki: Zou, J, et al.
Almmustuhtton: (1991)

Celebrations in Pioneering Electron Microscopy: A Symposium in Honor of Professor Archie Howie-Introduction.
Dahkki: Gai, P, et al.
Almmustuhtton: (2000)

Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate
Dahkki: Zou, J, et al.
Almmustuhtton: (1999)

Electron microscopy : methods and protocols /
Dahkki: Kuo, John
Almmustuhtton: (2007)

Hypothesis for a mechanism of beam-induced motion in cryo-electron microscopy
Dahkki: Robert E. Thorne
Almmustuhtton: (2020-05-01)

3D magnetic imaging using electron vortex beam microscopy
Dahkki: Frank Barrows, et al.
Almmustuhtton: (2022-12-01)

Active control of bright electron beams with RF optics for femtosecond microscopy
Dahkki: J. Williams, et al.
Almmustuhtton: (2017-07-01)

OPTIMIZATION AND CHARACTERIZATION OF ELECTRON BEAM RESIST USING ATOMIC FORCE MICROSCOPY
Dahkki: - Sutikno
Almmustuhtton: (2012-01-01)

A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy
Dahkki: Ming, W, et al.
Almmustuhtton: (2017)

Weakly Supervised Image Segmentation for Detecting Defects From Scanning Electron Microscopy Images in Semiconductor
Dahkki: Younghwan Lee, et al.
Almmustuhtton: (2024-01-01)