Elementary surface acoustic wave effects studied by scanning acoustic force microscopy

Elementary surface acoustic wave effects studied by scanning acoustic force microscopy

Scanning Acoustic Force Microscopy (SAFM) has been used to study elementary surface acoustic wave phenomena with nanoscale spatial resolution. The SAFM technique is capable of detecting acoustic wave properties of arbitrarily polarized modes with sub-wavelength resolution and unmatched sensitivity....

書誌詳細
主要な著者:	Hesjedal, T, Behme, G
フォーマット:	Conference item
出版事項:	2000

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